A 300 mm wafer rendered in hard-bin mode from synthetic die results. Use the toolbar above the map to switch plot mode, change colour scheme, rotate, flip, toggle die labels, zoom, and download a PNG. The Maps | Insights switch at the far right of the toolbar row (on by default; insights: { enabled: false } removes it) swaps the map for this wafer's own chart suite — yield and bin pareto, process capability, value distributions and test correlation, all from the bins and testValues already on each die.