A 300 mm wafer rendered in hard-bin mode from synthetic die results. Hover the canvas to reveal the toolbar — use it to switch plot mode, change colour scheme, rotate, flip, toggle die labels, zoom, and download a PNG. The toolbar's Insights button (opt-in via insights: { enabled: true }) swaps the map for this wafer's own chart suite — process capability, value distribution, and test correlation, all from the same parametric testValues already on each die.