§4 — Die size and wafer geometry Four inference levels — same data, different geometry context
The same die grid rendered four ways depending on how much geometry is supplied to buildWaferMap. A — no geometry, normalized units. B — die size only, diameter inferred. C — diameter only, pitch estimated, notch visible. D — fully specified with a 5 mm edge exclusion band (dimmed dies are excluded from yield).
A — grid positions only
Neither provided. Pitch inferred by nearest-neighbour step analysis. units: 'normalized' — proportionally correct but not in mm.
B — die size provided
dieConfig: { width: 8, height: 12 } — diameter inferred from grid extent × pitch. units: 'mm'
C — diameter provided
waferConfig: { diameter: 300 } — die pitch estimated from diameter ÷ grid extent. Notch visible. units: 'mm'
D — fully specified + edge exclusion
diameter: 300, notch: bottom, edgeExclusion: 5 mm, die: 8×12 mm. Dimmed dies fall within the 5 mm exclusion band and are excluded from yield.