Everything below is drawn by the library from the same data the map already has.
There is no charting call to make and no second library to add: pass
insights: { enabled: true } and the toolbar gains an
Insights tab holding thirteen panels across three views. This page
opens on that tab — defaultOpen: true — because the charts are the
subject here rather than the map.
The lot is eight wafers split across two process corners (POR and
Hi-dose, a ~50 mV Vth offset), with three parametric tests
that carry real spec limits, a functional continuity test, and a radial process
gradient. That is deliberate: each chart below needs something true in the data or
it is only a picture of noise. Use Group by → processSplit in the
Insights toolbar to separate the two corners.
Overview — 7 panels
Where the yield went, and which wafers differ.
- Yield by wafer — every wafer in the lot, sortable by yield or by ID.
The pass bins are named in the title, not assumed.
- Hard bin pareto — failing bins ranked by count, with a soft-bin toggle.
Names come from
hbinDefs, not bin numbers.
- Parametric pass rate · spec limits — pass rate per test against its limits.
Ranks which test is costing you most.
- Ring yield & Quadrant yield — yield per region on a wafer-shaped diagram, labelled in place.
Look for the edge ring falling away from the core.
- Test Values and Functional Tests tables — the numbers behind the charts, with their N stated.
Distributions — 4 panels
The shape of each measurement, not just its map colour.
- Value histogram — one test's distribution with its limits marked.
Vth is bimodal: that is the two splits.
- Test value distribution — box plots per test or per wafer.
Compare spread across the lot.
- Process capability — Cp/Cpk against the spec limits.
Needs limits; this is why
testDefs carry them.
- Wafer-to-wafer trend — a metric across the lot in order.
The two splits separate here.
Correlation — 2 panels
Which measurements move together — the question a wafer map cannot answer.
- Test correlation matrix — pairwise r across every test.
Idsat and Vth are coupled by the same process gradient.
- Test scatter — any two tests against each other, with limits.
Pick the pair the matrix flagged.