Metadata plot mode Generic categorical/layout views from die.metadata — coexists with test/bin data
Colour and legend the map by any per-die classification you already carry in die.metadata — project ownership on a multiproject wafer, vendor/third-party boundaries, reserved/shared areas, or any other host-defined grouping. Pass metadataFields to opt a key in, then switch to it from the toolbar's Metadata mode-menu section. No new die-level field is required — the example below deliberately mixes dies that have both a metadata classification and real hard-bin test results with dies that have metadata only, to show the two coexisting. The product mix is laid out the way a real multiproject reticle actually works: one reticle field holds several products (including two positions of the same product), and that fixed pattern is stepped across the whole wafer — toggle the toolbar's Reticle overlay to see the field boundaries the pattern repeats within.