On a multi-project wafer each reticle holds only a few of one product's dies, so the physical map is mostly empty and each die is a few pixels wide. When the occupied columns and rows repeat at a regular pitch, the Overlays menu offers Compact layout: the empty rows and columns are removed and each group of dies is outlined. Nothing is left out. Legends, yield and statistics are unchanged, and hover text and axis labels still give the original die coordinates. This wafer is synthetic: two products share a 14 × 10 die reticle. Try Axis labels in the same menu, rotate the map to see the XY indicator switch on, and open Layout diagnostics to see what the detector saw, as counts and scores only.