The Summary panel shows metadata, yield, bin breakdown, ring/quadrant yield, test values, and detected anomalies (StatsSummary.findings, with severity/kind/region filter controls), plus a combined "Summary report" button — always docked next to the map so a clicked finding can highlight the affected dies right there. The same bin/ring/quadrant/test-value numbers are also available as charts in the Insights tab's Overview sub-tab (see the gallery demo) — a full-takeover view for deeper exploration, reading the same underlying computation so the two surfaces never disagree. The top example uses summaryPanel: { placement: 'right' } for a fixed always-visible panel. The gallery below uses lotStatsSummary for lot-level stats and findings; click a card header to drill into that wafer's per-wafer summary.