wafermapMulti-site parallel testing
DieResult.siteNum · DieResult.partId · test-site analysis in the stats engine
Modern probers test multiple dies simultaneously using a multi-site probe card.
Pass siteNum (from STDF site_num) on each DieResult to
enable per-site analysis. analyzeWaferMap automatically compares yield and bin
distributions across sites when meaningful duplication is detected.
The injected site-3 defect (lower yield) appears as a finding in the panel on the right.
Toggle between sites using the controls above to colour dies by their assigned site.
Colour by
Injected defect
Probe card configuration
Sites
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Layout
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Dies / site
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partId range
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Site populations
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About multi-site testing
A multi-site probe card contacts several dies simultaneously. The tester
records site_num (STDF) on each result to identify which
contact point tested which die. Systematic contact problems, pin misalignment,
or prober chuck tilt show up as per-site yield or parametric deviations.