Modern probers test multiple dies simultaneously using a multi-site probe card. Pass `siteNum` (from STDF `site_num`) on each `DieResult` to enable per-site analysis. `analyzeWaferMap` automatically compares yield and bin distributions across sites when meaningful duplication is detected. The injected site-3 defect (lower yield) appears as a finding in the panel on the right. Toggle between sites using the controls above to colour dies by their assigned site.
Colour by
Injected defect
Probe card configuration

Sites | —
Layout | —
Dies / site | —
partId range | —

Site populations

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About multi-site testing
A multi-site probe card contacts several dies simultaneously. The tester records `site_num` (STDF) on each result to identify which contact point tested which die. Systematic contact problems, pin misalignment, or prober chuck tilt show up as per-site yield or parametric deviations.