# wafermap examples

Offline examples package — wafermap v0.23.1. The library is bundled in `../dist/`; every page here runs with no network access. Start with Your first wafer map, or copy ../starter/ as the seed for your own app. Guide links open the online documentation.

## Getting started

- Your first wafer map minimal two-call example, no CSV Guide §2
- Loading CSV data parse and map real columnar data Guide §3
- Geometry inference omit die size and let the library infer it Guide §4
- Partial data and centre anchoring anchoring the wafer centre for partial coverage, and why sparse data doesn't need it Guide §4
- Warnings the library surfaces the built-in ⚠ indicator, warning severity, and the `onWarning` opt-out for hosts with their own notification UI Guide §4
- Bins and yield named hard bins, pass/fail colours, yield label Guide §5
- Metadata / layout mode generic categorical colouring from `die.metadata`, coexists with test/bin data Guide §21
- Test values parametric measurements, spec limits, colorbar Guide §6
- Retests multi-touch probe sequences and retest policy Guide §7

## Interaction and control

- Display control rotation, flip, plot mode, colour scheme Guide §8
- Custom colour schemes register your own bin/value palette with `registerColorScheme` Guide §18
- Theming theme the chrome and canvas with `--wmap-*` custom properties (light, dark, Nord, Solarized, brand green) Guide §8
- Interaction API hover, click, box-select, controller methods Guide §9
- Web Worker off-main-thread build for large datasets Guide §17

## Analysis and layout

- Statistical findings ring, quadrant, cluster, edge-arc analysis on a single wafer Guide §10
- Summary panel persistent metadata and stats sidebar docked beside the map Guide §11
- Lot gallery card grid of multiple wafers with shared controls and stacked modes Guide §12
- Lot-level findings cross-wafer trend detection with `analyzeWaferLot` Guide §13
- Lot-stack spatial analysis mean/median/stddev maps aggregated across a lot Guide §19
- Reticle overlays photolithography field grid and reticle-position findings Guide §15
- Multi-site parallel testing site-based analysis across a multi-site prober card
- Real wafer data (WM-811K) open dataset with 811 000 wafer records Guide §10
- Mixed patterns (MixedWM38) classified failure pattern dataset Pattern Detection

## Compatibility and advanced

- Rendering pipeline low-level buildView / toCanvas pipeline Guide §20
- wafermap vs Plotly.js side-by-side render timings and feature comparison Performance

## Unlisted

- Showcase all features in one page, good for a quick overview once you know the basics
- Quick Start — live the minimal inline-generated example linked from the Quick Start page