MixedWM38 extends the WM-811K dataset with compound defect patterns — wafers labelled with two, three, or four co-occurring defect types simultaneously (e.g. Center+Edge-Ring+LOC). The dataset contains 38,015 wafer maps across 38 classes, encoded as 52×52 grids with 8 base defect types combined via multi-hot labels.
One wafer per class is loaded directly into `buildWaferMap` and `analyzeWaferMap` with no special configuration. Card labels show the MixedWM38 class name and how many statistical findings the library detected. Click ↗ on any card to open a full interactive view with the findings panel. Compound patterns often produce findings from multiple spatial families simultaneously.