When the same die position appears more than once in the input, `buildWaferMap` resolves it using a retest policy. last (default) keeps the final result; first keeps the initial probe; best keeps the pass result when one exists (using `passBins`), falling back to the lowest hbin as a tiebreaker among failures; worst prefers a fail result, falling back to the highest hbin. Dies with multiple probes get a `retestCount` — click any die to see its details.
Retest policy
Click a die on the map to see its retest details
Retest summary
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Retested dies
last
Active policy
Clicked die
Click a die on the map
Retested positions