WM-811K is a public dataset of 811,457 wafer maps from real 300 mm fabrication lines, labelled with nine defect categories (edge ring, scratch, donut, local cluster, and so on). The 27 maps below — three per defect type — are loaded directly into `buildWaferMap` and `analyzeWaferMap` with no special configuration. Each card label shows the WM-811K defect category and how many statistical findings the library detected. Click the ↗ icon on any card to open a full interactive view with the findings panel.