Visualise semiconductor test data instantly — yield patterns, spatial anomalies, parametric distributions, and stacked lot views. Load your own CSV or JSON below, or explore the demo scenarios now.
── Try with your own data ─────────────────────────────────
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Drop a file here
CSV or JSON with die-level test results.
Columns are detected automatically — you can review them before rendering.
Maximum file size: 20 MB · Rows beyond 500,000 are skipped
Map columns to die fields

Column in file |  | Maps to | Display name (test values only) | Split gallery (display info only)
--- | --- | --- | --- | ---

Building wafer maps…
Long format detected
Toolbar guide
Plot mode
Plot modeSwitch between hard bin, soft bin, test value, and stacked lot views. Only modes valid for your data are shown.
AggregationIn stacked mode, choose how values are combined across wafers: mean, median, min, max, std dev, count, or bin occurrence.
Colorbar rangeIn test value mode, toggle whether the colorbar spans the data range or the spec limits.
Log scaleApply a logarithmic colour scale — useful for leakage currents and other exponentially distributed parameters.
View controls
Zoom modeDrag to draw a zoom rectangle. Scroll wheel zooms at the cursor. Double-click resets.
Pan modeDrag to move the view.
Reset zoomReturn to the default full-wafer view. Also triggered by double-clicking the canvas.
OrientationDropdown menu: rotate 90° clockwise, flip horizontal, or flip vertical. All coordinates shown are always original die grid positions.
ColumnsFix the gallery to 1–5 columns, or choose Auto to let the gallery size cards based on die pitch so all available space is used.
Overlays
OverlaysDropdown menu: Ring boundaries, Quadrant lines, Die labels, Reticle grid (when reticle data is present), XY axis indicator. Multiple overlays can be active at once.
Legend styleDropdown menu: reposition the bin colour legend (default, compact, left, top, bottom, floating).
Colour schemeSwitch between colour palettes for test value and stacked modes.
Analysis
Summary panelOpen yield stats, bin breakdown, and spatial findings (ring, quadrant, cluster anomalies) for this wafer. In the gallery bar, opens the lot-level findings panel.
Select diesDrag to select a region of dies. Ctrl+click to add individual dies. Selected dies are shown in the tooltip.
Export
Download PNGSave the current wafer view as a PNG image.
Download allSave a composite PNG of the entire gallery.