wafermap examples

Offline examples package — wafermap v0.23.1. The library is bundled in ../dist/; every page here runs with no network access. Start with Your first wafer map, or copy ../starter/ as the seed for your own app. Guide links open the online documentation.

Getting started

• Your first wafer map minimal two-call example, no CSV Guide §2
• Loading CSV data parse and map real columnar data Guide §3
• Geometry inference omit die size and let the library infer it Guide §4
• Partial data and centre anchoring anchoring the wafer centre for partial coverage, and why sparse data doesn't need it Guide §4
• Warnings the library surfaces the built-in ⚠ indicator, warning severity, and the onWarning opt-out for hosts with their own notification UI Guide §4
• Bins and yield named hard bins, pass/fail colours, yield label Guide §5
• Metadata / layout mode generic categorical colouring from die.metadata, coexists with test/bin data Guide §21
• Test values parametric measurements, spec limits, colorbar Guide §6
• Retests multi-touch probe sequences and retest policy Guide §7

Interaction and control

• Display control rotation, flip, plot mode, colour scheme Guide §8
• Custom colour schemes register your own bin/value palette with registerColorScheme Guide §18
• Theming theme the chrome and canvas with --wmap-* custom properties (light, dark, Nord, Solarized, brand green) Guide §8
• Interaction API hover, click, box-select, controller methods Guide §9
• Web Worker off-main-thread build for large datasets Guide §17

Analysis and layout

• Statistical findings ring, quadrant, cluster, edge-arc analysis on a single wafer Guide §10
• Summary panel persistent metadata and stats sidebar docked beside the map Guide §11
• Lot gallery card grid of multiple wafers with shared controls and stacked modes Guide §12
• Lot-level findings cross-wafer trend detection with analyzeWaferLot Guide §13
• Lot-stack spatial analysis mean/median/stddev maps aggregated across a lot Guide §19
• Reticle overlays photolithography field grid and reticle-position findings Guide §15
• Multi-site parallel testing site-based analysis across a multi-site prober card
• Real wafer data (WM-811K) open dataset with 811 000 wafer records Guide §10
• Mixed patterns (MixedWM38) classified failure pattern dataset Pattern Detection

Compatibility and advanced

• Rendering pipeline low-level buildView / toCanvas pipeline Guide §20
• wafermap vs Plotly.js side-by-side render timings and feature comparison Performance

Unlisted

• Showcase all features in one page, good for a quick overview once you know the basics
• Quick Start — live the minimal inline-generated example linked from the Quick Start page