What's New¶

A plain-language, timelined summary of new and meaningfully improved capabilities across wafermap and tsmap — for people using the app, or building on the library, not for contributors. Only genuinely user/adopter-facing capabilities are listed here: internal refactors, dependency bumps, docs-only fixes, and process/tooling changes are skipped, even when they're a real fix worth having. For the complete technical record of everything that shipped, see each project's own changelog: wafermap · tsmap.

Covers everything since both projects moved to the wafertools GitHub org and @wafertools npm scope (2026-08-01) — see each changelog directly for anything earlier.

2026-08-16 — Filter large batches before loading; wafer maps handle data with no position info¶

tsmap can now scan a large batch of files — a whole directory of lots, say — for their lot/wafer metadata before loading any of them, and show the results in a sortable, filterable table. Pick just the files you actually want from many, rather than loading everything and sorting it out afterward. The scan reads only header-level information (lot ID, part type, tester, wafer count, dates, etc), so it stays fast even across a large batch. A filter can be saved and reloaded, and the last one you used is remembered automatically.

Both wafermap and tsmap now handle wafer test data that has no reported die x/y positions at all — a wafer-number-only test log, or a lot where some dies report a position and others don't. This used to be silently dropped; it's now kept, with the wafer shown as a bin breakdown or value histogram instead of a fabricated map (which would risk being misread as real spatial data), plus a full exportable die list. Yield, bin counts, and per-test statistics are unaffected either way — only spatial analysis (rings, quadrants, clustering) doesn't apply to a die with no position.

Also: a pass over keyboard and screen-reader accessibility across wafermap's summary panel, chart legends, and die-list tables.

See: tsmap v0.1.27, wafermap v0.23.0

2026-08-15 — Parquet support, load data straight from a URL, native file associations¶

tsmap now opens .parquet files alongside STDF/ATDF/CSV/JSON, through the same column mapping used for CSV/JSON — useful if your data pipeline already lands in a columnar format rather than raw test-log files.

If your data lives behind an API or on a server rather than on your own filesystem, tsmap can now fetch and load it directly: tsmap --url <url> --url-format <format> on desktop, or a ?dataUrl=&dataFormat= link for the browser build — no need to download a file by hand first. A caller application (your own data-selection tool, a script) can hand tsmap a URL and have it open immediately. Header-based authentication is supported on desktop for APIs that need it. A tsmap://open?url=... link lets a web page launch the desktop app directly with data to load, and on Windows/macOS/Linux tsmap can now register itself as the default handler for .stdf/.atdf/.parquet files, so double-clicking one in a file manager just opens it.

See: tsmap v0.1.26

2026-08-09 — A full accessibility pass; test numbers stay stable when you reorder columns¶

tsmap had a full UI and accessibility review: keyboard focus is now visible everywhere, modal dialogs trap Tab and restore focus correctly, every theme now meets WCAG AA contrast for primary buttons, and several dialogs gained proper Escape/Enter/backdrop-click handling that some had been missing.

For CSV/JSON data, test numbers are now a stable identity derived from the test's own name or source column, rather than the order it happened to appear in the file — so reordering or adding/removing columns no longer silently reshuffles which test is which. Loading a previously-saved test selection now recovers a renumbered test by matching its name instead of losing track of it.

See: tsmap v0.1.25

2026-08-04 to 2026-08-07 — wafermap tells you when it's had to skip something; a downloadable offline examples package¶

wafermap now surfaces its own advisories directly in the UI — a warning indicator appears whenever, for example, it had to guess at wafer geometry from the data, or capped analysis at 250 tests and skipped the rest. Previously some of these were invisible unless you went looking; now there's always a visible signal when something might be off, in both the standalone map view and tsmap, which picked this up automatically. Findings that used to repeat the same fact several times (a hard-bin row, its identical soft-bin twin, and a yield row all restating one edge failure) now collapse into one.

For anyone evaluating or integrating wafermap itself, every example now ships as a downloadable, offline-capable archive — unzip and open, no build step, no network required, which matters on a locked-down fab network.

See: tsmap v0.1.24, wafermap v0.22.0

2026-08-02 — More accurate edge-die yield¶

tsmap's displayed yield numbers are now more accurate for wafers where the physical geometry has to be inferred from the data rather than read from an explicit map file: dies at the wafer edge that were actually tested were sometimes wrongly treated as falling outside the wafer and dropped from yield and statistics entirely. Every affected die was a genuine tested site, so recovering them means displayed yield can shift slightly, and is now correct.