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Features

A tour of what tsmap does. For step-by-step instructions on any of this, see the user guide — this page covers capability and benefit, not the click-by-click.

Open any format

STDF, ATDF, CSV, and JSON — all multi-wafer by default, and all mergeable into one gallery from several files at once. Gzip (.gz) and Zip (.zip) archives are handled transparently.

Multi-wafer gallery

STDF and ATDF are parsed natively in Rust on both platforms (compiled to WebAssembly for the browser), which is where tsmap's speed comes from: a 341 MB / 266,000-die STDF lot parses in about 3.5 seconds (~96 MB/s) on a 2021 ThinkPad laptop, and about 2.3 seconds (~148 MB/s) on a small desktop. CSV and ATDF parsing saw similar jumps in a 2026 rewrite — CSV about 3.4× faster, ATDF about 2.8× faster.

See Supported file formats and Opening files in the user guide.

Two-pass test selector

STDF/ATDF files with a lot of tests get a fast first-pass scan, then a selector overlay to choose which tests to actually import — before the full parse runs. Selections (and renames) can be saved to a file and reloaded later, or supplied on the command line.

Test selector overlay

See Test selector in the user guide.

Interactive wafer maps

Yield, soft-bin, and per-test parametric heat-map views, with zoom, pan, and hover. Spatial findings (edge effects, clustering) are always computed; an optional value-findings mode adds statistical outlier detection on top.

Wafer map in test-value mode Wafer map in soft-bin mode

See The wafer map view in the user guide.

Wafer splits — compare process corners

Attach an arbitrary label to each wafer — a process corner (TT/FF/SS/FS/SF), an experiment group, anything not present in the source file — and save/load the assignment as CSV. Splits feed straight into every chart's Group by control.

Splits dialog with corners loaded Gallery showing split labels on each card

See Wafer splits in the user guide.

Charts & Insights

The Insights tab (wafermap's own built-in chart suite) covers yield, bin pareto, process capability, boxplot, histogram, correlation matrix, and scatter — organized into Overview, Distributions, and Correlation sub-tabs, with a shared Group by control (lot, program, tester, node, part type, or any wafer split) and click-through drilldown.

Insights Overview — yield, bin pareto, ring/quadrant yield, test values

Yield by wafer, expanded Bin pareto, expanded Test value distribution boxplot, expanded
Value histogram, expanded Test correlation matrix, expanded Test scatter, expanded

Grouping and drilldown work together: group the Overview by a wafer split to see yield and bin pareto broken out per corner, then click a group's bar to drill in-place to that corner's own per-wafer view.

Insights Overview grouped by Split Yield drilled into a single Split

See Insights tab in the user guide.

Export & desktop/browser parity

Every chart has a camera button for a clean PNG export at full resolution, and the wafer map toolbar has its own PNG export too. The desktop app and browser build share the same Rust parsing core and the same rendering — same maps, same charts, both fully local and both usable offline once loaded.

Wafer map toolbar with the plot-mode dropdown open

See Exporting charts and the full desktop vs browser comparison in the web app page.