Features¶

A tour of what tsmap does. For step-by-step instructions on any of this, see the user guide — this page covers capability and benefit, not the click-by-click.

Open any format¶

STDF, ATDF, CSV, JSON, and Parquet — all multi-wafer by default, and all mergeable into one gallery from several files at once. Gzip (.gz) and Zip (.zip) archives are handled transparently.

STDF and ATDF are parsed natively in Rust on both platforms (compiled to WebAssembly for the browser), which is where tsmap's speed comes from: a 341 MB / 266,000-die STDF lot parses in about 3.5 seconds (~96 MB/s) on a 2021 ThinkPad laptop, and about 2.3 seconds (~148 MB/s) on a small desktop. CSV and ATDF parsing saw similar jumps in a 2026 rewrite — CSV about 3.4× faster, ATDF about 2.8× faster.

See Supported file formats and Opening files in the user guide.

Find the right files before you open them¶

Pointed at a directory of hundreds of lots, Filter files… reads only each file's header metadata — lot ID, part type, tester, job name, wafer count, start and finish times, site count — and lays them out as one row per file. Sort, filter per column, or search across all of them, then load just the subset you actually want; the rest are never parsed. A filter can be saved and reloaded, so a recurring selection is a file rather than a habit. Because the scan skips die and test records entirely, it stays quick over a large batch.

Two-pass test selector¶

STDF/ATDF files with a lot of tests get a fast first-pass scan, then a selector overlay to choose which tests to actually import — before the full parse runs. Selections (and renames) can be saved to a file and reloaded later, or supplied on the command line.

See Test selector in the user guide.

Interactive wafer maps¶

Yield, soft-bin, and per-test parametric heat-map views, with zoom, pan, and hover. Spatial findings (edge effects, clustering) are always computed; an optional value-findings mode adds statistical outlier detection on top.

See The wafer map view in the user guide.

Dies with no reported position¶

X/Y position is optional in every format. A wafer with no reported position never renders as a fabricated map — showing dies at synthetic positions risks being misread as real spatial data. Instead it shows a compact summary that follows the current plot mode — a bin breakdown in the map's own colours for hard/soft-bin modes, or a histogram (also colour-matched, and log-scale/spec-range aware like the map's colorbar) for value mode — with a one-click toggle to the full die list when you need exact values or CSV export. A wafer that's only partly positioned renders its map for the dies that do have coordinates, plus an expandable "+N dies without position data" footer offering the same chart/die-list toggle for the rest. Yield, bin counts, and per-test statistics still count every die either way — only spatial findings (edge ring, quadrants, clustering) are scoped to positioned dies. A lot-wide combined die list, also CSV-exportable, is available from the toolbar's Setup ▾ menu for any multi-wafer load.

See Dies with no reported position in the user guide.

Wafer splits — compare process corners¶

Attach an arbitrary label to each wafer — a process corner (TT/FF/SS/FS/SF), an experiment group, anything not present in the source file — and save/load the assignment as CSV. Splits feed straight into every chart's Group by control.

See Wafer splits in the user guide.

Charts & Insights¶

The Insights tab (wafermap's own built-in chart suite) covers yield, bin pareto, process capability, boxplot, histogram, correlation matrix, and scatter — organized into Overview, Distributions, and Correlation sub-tabs, with a shared Group by control (lot, program, tester, node, part type, or any wafer split) and click-through drilldown.

Grouping and drilldown work together: group the Overview by a wafer split to see yield and bin pareto broken out per corner, then click a group's bar to drill in-place to that corner's own per-wafer view.

See Grouping data in the Insights tab in the user guide.

Export & desktop/browser parity¶

Every chart has a camera button for a clean PNG export at full resolution, and the wafer map toolbar has its own PNG export too. The desktop app and browser build share the same Rust parsing core and the same rendering — same maps, same charts, and both fully local. The browser build caches itself on first visit, so it works offline too, and Chrome, Chromium and Edge can install it as an app with its own window and launcher entry.

See Exporting a chart in the full wafer map guide, and the full desktop vs browser comparison in the web app page.

Open directly from your own systems¶

A caller application — your own data-selection page, a script, a scheduled task — can hand tsmap a URL and have it fetch and load the data itself, no manual download/upload step for the user. On desktop: tsmap --url <url> --url-format <format>, or a tsmap://open?url=...&format=... link that launches the installed app straight from a web page click. In the browser: ?dataUrl=&dataFormat= as a query param on the app's own URL. Desktop also supports --url-headers <file> for data APIs that authenticate via a header rather than a self-authenticating link.

Once a file is associated with tsmap (Help → File associations…, desktop only), double-clicking a .stdf/.atdf/.parquet file in a file manager opens it in tsmap directly — an in-app setting, changeable anytime, rather than something locked in at install.

See Opening data from a URL and File associations in the user guide, and the full integration guide for architecture options (presigned URLs, a download proxy, same-origin SSO) if you're wiring this up against your own data API.