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Performance

For: developers sizing up the library or tuning large-lot workloads.

The wafermap library is fast. Rendering the map is effectively instant, and every optional analysis feature — the Summary panel's statistics, the Insights tab's charts, automatic spatial finding detection — completes in single-digit to low double-digit milliseconds for a typical wafer. This page exists so you can pick features by what they do, not out of worry about what they cost — but if you're curious, or you're working with very large lots, here are the actual numbers.

How to read the numbers below: timings were measured on a 3-year-old mini-desktop running Ubuntu — not tuned, not server-grade hardware. If anything, expect better numbers on a typical dev machine or a user's browser. Percentages are included alongside the milliseconds purely as a size comparison between features, not as a warning sign — a feature going from 4ms to 9ms is still 9ms.


The short version

Every optional feature costs low single-digit to low double-digit milliseconds per wafer — the kind of cost that's invisible to a user, even on a full production-density wafer. There's exactly one feature worth knowing about before you flip it on for every wafer in a large lot: automatic spatial finding detection (enableTestValueAnalysis), which is the most powerful option (it finds statistical anomalies for you) and also the priciest — still comfortably under 110ms on the largest wafer we tested, but the one to reach for deliberately rather than as a default. Everything else — the Summary panel, distribution charts, all of the Insights tab — is cheap enough to enable freely. Two Insights panels even get faster for free if the Summary panel already ran first.


What each option actually buys you

Option What you get Where it shows up
(none — just buildWaferMap + renderWaferMap) The interactive map itself Always
analyzeWaferMap() — no extra flags Yield %, bin breakdown, ring/quadrant yield, basic findings Summary panel, Insights → Overview
analyzeWaferMap({ computePerTestStats: true }) Per-test five-number summaries (min/Q1/median/Q3/max) Insights → Distributions (box plot)
analyzeWaferMap({ enableTestValueAnalysis: true }) Automatic spatial statistical findings — flags regions where a test's values differ significantly (Welch's t-test per region) Findings sidebar, Summary panel's findings list
insights: { enabled: true } (Insights tab) Process capability, distributions, correlation charts Insights tab (opt-in toolbar button)
analyzeWaferLot(..., { perWaferSummaries }) Lot-level findings + reuses per-wafer stats you already computed Gallery's lot Summary panel

computePerTestStats and enableTestValueAnalysis are alternatives, not a ladder — pick the cheaper one unless you specifically need automatic spatial finding detection. enableTestValueAnalysis computes distributions internally too, so you don't need both.


Measured cost, by wafer size

Full 300mm wafers, 15 parametric tests per die — a realistic count for analysing a subset of DC/AC parametrics from a production test program, not a toy single-test example. buildWaferMap (drawing the map) is included as a reference point — it's mandatory, everything else is opt-in on top of it.

Wafer size buildWaferMap analyzeWaferMap() (Summary panel) + computePerTestStats + enableTestValueAnalysis
Small (~150 dies) 1.0ms 1.2ms (+117% total) 1.7ms (+165% total) 4.8ms (+475% total)
Medium (~1,000 dies) 4.4ms 5.1ms (+114% total) 10.5ms (+236% total) 33.6ms (+759% total)
Large (~4,200 dies) 12.2ms 18.4ms (+151% total) 37.6ms (+308% total) 129.4ms (+1060% total)

("total" % is the combined buildWaferMap + analyzeWaferMap pipeline cost relative to buildWaferMap alone — included for scale comparison, not as a target to avoid.)

Every number in the first three columns is small enough to not think about — low double-digit milliseconds even at 4,200 dies × 15 tests. enableTestValueAnalysis is the one to be deliberate about: it compares every region against every other region for every test, so it scales with both die count and test count, and on the largest, densest wafer with 15 tests it reaches ~130ms. Still fast for a one-off computation — just not something you'd want re-running on every frame of an animation, and worth knowing it grows with how many tests you hand it (more on that below).


Only pass the tests you'll actually use

testDefs should be the tests you intend to analyze or display — not necessarily every test in the underlying test program. A few features scale with test count, and one of them (test correlation) scales quadratically, since it compares every test against every other test:

Tests passed computePerTestStats enableTestValueAnalysis buildCorrelationMatrix (pairs)
6 8.7ms 25.1ms 0.2ms (15 pairs)
15 10.7ms 36.5ms 1.2ms (105 pairs)
30 14.7ms 49.5ms 4.1ms (435 pairs)
60 16.8ms 90.6ms 16.4ms (1,770 pairs)

(medium/~1,000-die wafer, held constant — only the test count changes)

None of this is expensive at reasonable test counts (15–30 is typical), but if your data source hands you a full parametric test program with hundreds of tests and only a handful are ever shown to the user, filter testDefs down to the ones you actually chart or analyze before passing it in — the library has no way to know which tests you care about, so it treats every testDef you give it as one worth analyzing.


The Insights tab: fast alone, faster still if the Summary panel already ran

Every Insights panel computes in single-digit milliseconds, even on the largest wafer tested (the priciest panel, process capability, tops out around 21ms at 4,200 dies × 15 tests). Two panels — box plot and bin pareto — get even cheaper if the Summary panel already computed its stats, since they can reuse that work instead of re-scanning every die:

Panel Computed standalone Reusing the Summary panel's stats
Box plot up to ~1ms ~2µs
Bin pareto up to ~175µs ~2µs
Capability, correlation, scatter, histogram up to ~21ms (always reads raw die values — no reuse path, by design)

Practical effect: if a user opens the Summary panel first and then the Insights tab, box plot and bin pareto are effectively free. If Insights is the first thing they open, everything computes fresh — still fast, just not quite as fast.


Galleries: let analyzeWaferLot reuse work you already did

If you're building a gallery and computing statsSummary for each card and a lot-level lotStatsSummary, pass the per-wafer results you already have — it's a free win:

const waferSummaries = results.map(r => analyzeWaferMap(r));
const lotSummary = analyzeWaferLot(results, {
  perWaferSummaries: waferSummaries,   // ← reuse, don't let it recompute
});

Without perWaferSummaries, analyzeWaferLot quietly redoes the entire per-wafer analysis itself internally — for a 6-wafer lot, that's roughly six times the per-wafer analyzeWaferMap cost from the table above, paid a second time for no benefit. With perWaferSummaries supplied, the lot-level pass adds no measurable time on top of the per-wafer work you already did. Either way the absolute cost is small at typical lot sizes — this is a free optimization worth taking, not a fix for a real bottleneck.


You're building… Recommended options Why
A simple embedded viewer, no stats UI Nothing extra — just buildWaferMap + renderWaferMap No reason to compute analysis nobody sees
A viewer with yield/bin summary analyzeWaferMap(), no extra flags Fast, powers the whole Summary panel
…plus distribution/box-plot charts + computePerTestStats: true Still fast; unlocks Insights → Distributions
A QA/engineering tool that should flag anomalies automatically + enableTestValueAnalysis: true The only option that finds spatial patterns for you automatically — the one worth being deliberate about on very large lots (see below)
A lot gallery (many wafers) Always pass perWaferSummaries to analyzeWaferLot Free reuse of work you already did
Very large lots using enableTestValueAnalysis on every wafer Run analysis in a Web Worker via createWafermapWorker Keeps the main thread free while the heavier pass runs, even though each individual call is fast
A dashboard rendering many wafers/lots at once Compute statsSummary for every card, then open Insights on demand Box plot and bin pareto ride along nearly free once Summary panel stats exist
Any app, if your data source has a large parametric test program Filter testDefs down to the tests you actually analyze/display Correlation and enableTestValueAnalysis both scale with test count — unused tests cost you for nothing shown to the user

Methodology, if you want to reproduce this

Wafer sizes above are full 300mm wafers with realistic die pitch (small: ~20mm die, medium: ~8mm die, large: ~4mm die), 15 parametric tests per die (the test-count table varies this deliberately), 8% fail rate, deterministic synthetic data. Each number is the median of many repeated runs (9–41, more reps for smaller/faster operations) to cancel out timer jitter and GC pauses — a single-shot timing at this scale isn't trustworthy. Every function measured is a real, unmodified library export, run against the actual built dist/ output, on a 3-year-old SER5-Pro desktop (Ubuntu) — nothing exotic, and a typical modern machine should do at least as well.